Rachel Noek, Geert Vrijsen, Daniel Gaultney, Emily Mount, Taehyun Kim, Peter Maunz, Jungsang Kim
Fast and efficient detection of the qubit state in trapped ion quantum information processing is critical for implementing quantum error correction and performing fundamental tests such as a loophole-free Bell test. In this work we present a simple qubit state detection protocol for a $^{171}$Yb$^+$ hyperfine atomic qubit trapped in a microfabricated surface trap, enabled by high collection efficiency of the scattered photons and low background photon count rate. We demonstrate average detection times of 10.5, 28.1 and 99.8\,$\upmu$s, corresponding to state detection fidelities of 99%, 99.85(1)% and 99.915(7)%, respectively.
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http://arxiv.org/abs/1304.3511
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