Friday, January 4, 2013

1301.0218 (J. Tisler et al.)

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene    [PDF]

J. Tisler, T. Oeckinghaus, R. Stöhr, R. Kolesov, F. Reinhard, J. Wrachtrup
We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.
View original: http://arxiv.org/abs/1301.0218

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